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2012
Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2012.  Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures. Journal of Applied Physics. 111:5. Abstract
Liu F, Lee CJ, Chen JQ, Louis E, van der Slot PJM, Boller KJ, Bijkerk F.  2012.  Ellipsometry with randomly varying polarization states. Optics Express. 20:870-878. Abstract
van den Boogaard AJR, van Goor FA, Louis E, Bijkerk F.  2012.  Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters. 37:160-162. Abstract
Kuznetsov AS, Gleeson MA, Bijkerk F.  2012.  Hydrogen-induced blistering mechanisms in thin film coatings. Journal of Physics-Condensed Matter. 24:6. Abstract
Medvedev VV, Yakshin AE, van de Kruijs RWE, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F.  2012.  Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors. Optics Letters. 37:1169-1171. Abstract
2011
van den Boogaard AJR, Louis E, Zoethout E, Goldberg KA, Bijkerk F.  2011.  Characterization of Mo/Si multilayer growth on stepped topographies. Journal of Vacuum Science & Technology B. 29:6. Abstract
Medvedev VV, Yakshin AE, van de Kruijs RWE, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F.  2011.  Infrared suppression by hybrid EUV multilayer-IR etalon structures. Optics Letters. 36:3344-3346. Abstract
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RWE, Boekhout F, Gullikson E, Gaudin J et al..  2011.  Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics Letters. 36:3386-3388. Abstract
Chen JQ, Louis E, Wormeester H, Harmsen R, van de Kruijs R, Lee CJ, van Schaik W, Bijkerk F.  2011.  Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology. 22:8. Abstract
Chen JQ, Louis E, Harmsen R, Tsarfati T, Wormeester H, van Kampen M, van Schaik W, van de Kruijs R, Bijkerk F.  2011.  In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers. Applied Surface Science. 258:7-12. Abstract
Louis E, Yakshin AE, Tsarfati T, Bijkerk F.  2011.  Nanometer interface and materials control for multilayer EUV-optical applications. Progress in Surface Science. 86:255-294. Abstract
Makhotkin IA, Louis E, van de Kruijs RWE, Yakshin AE, Zoethout E, Seregin AY, Tereschenko EY, Yakunin SN, Bijkerk F.  2011.  Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi a-Applications and Materials Science. 208:2597-2600. Abstract
Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F.  2011.  Erratum to 'Co-adsorption of NH(3) and SO(2) on quartz(0 0 0 1): Formation of a stabilized complex (vol 511, pg 270, 2011)'. Chemical Physics Letters. 516:111-111.
Kozhevnikov IV, van der Meer R, Bastiaens HMJ, Boller KJ, Bijkerk F.  2011.  Analytic theory of soft x-ray diffraction by lamellar multilayer gratings. Optics Express. 19:9172-9184. Abstract
Rouzee A, Johnsson P, Gryzlova EV, Fukuzawa H, Yamada A, Siu W, Huismans Y, Louis E, Bijkerk F, Holland DMP et al..  2011.  Angle-resolved photoelectron spectroscopy of sequential three-photon triple ionization of neon at 90.5 eV photon energy. Physical Review A. 83:4. Abstract
de Rooij-Lohmann V, Yakshin AE, Zoethout E, Verhoeven J, Bijkerk F.  2011.  Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science. 257:6251-6255. Abstract
Sobierajski R, Bruijn S, Khorsand AR, Louis E, de Kruijs R, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J et al..  2011.  Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express. 19:193-205. Abstract
Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2011.  In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science. 257:2707-2711. Abstract
Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F.  2011.  Co-adsorption of NH(3) and SO(2) on quartz(0001): Formation of a stabilized complex. Chemical Physics Letters. 511:270-276. Abstract
2010
Tsarfati T, van de Kruijs RWE, Zoethout E, Louis E, Bijkerk F.  2010.  Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films. 518:7249-7252. Abstract