] Filters: Author is Bijkerk, F. [Clear All Filters]
.
2012. Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters. 37:160-162. Abstract
.
2012. Thermally induced interface chemistry in Mo/B4C/Si/B4C multilayered films. Journal of Applied Physics. 112:5. Abstract
.
2010. Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology. 205:2469-2473. Abstract
.
2008. Thermally enhanced interdiffusion in Mo/Si multilayers. Journal of Applied Physics. 103:6. Abstract
.
2007. Temperature-dependent nanocrystal formation in Mo/Si multilayers. Physical Review B. 76
.
2010. Surface morphology of Kr+-polished amorphous Si layers. Journal of Vacuum Science & Technology A. 28:552-558. Abstract
.
2012. Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors. Applied Optics. 51:8541-8548. Abstract
.
2008. Stress Reduction in Multilayers Used for X-Ray and Neutron Optics. Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences. Vol. 137
.
2009. Sputtering yields of Ru, Mo, and Si under low energy Ar+ bombardment. Journal of Applied Physics. 106:6. Abstract
.
2008. Spectral-purity-enhancing layer for multilayer mirrors. Optics Letters. 33:560-562. Abstract
.
2012. Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express. 20:11778-11786. Abstract
.
2012. Spectral and spatial structure of extreme ultraviolet radiation in laser plasma-wall interactions. Plasma Physics and Controlled Fusion. 54:6. Abstract
.
2013. Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range. Aip Advances. 3:012103. Abstract
.
2010. Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express. 18:700-712. Abstract
.
2006. Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors. Surface Science. 600:1405-1408.
.
2010. Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science. 257:354-361. Abstract
.
2010. Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science. 256:5011-5014. Abstract
.
2008. Reflectivity and surface roughness of multilayer-coated substrate recovery layers for EUV lithographic optics. Optical Engineering. 47:5. Abstract
.
2009. Reflective multilayer optics for 6.7 nm wavelength radiation sources and next generation lithography. Thin Solid Films. 518:1365-1368. Abstract
.
2011. Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science. 257:6251-6255. Abstract