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2012
Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2012.  Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures. Journal of Applied Physics. 111:5. Abstract
Medvedev VV, Yakshin AE, van de Kruijs RWE, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F.  2012.  Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors. Optics Letters. 37:1169-1171. Abstract
2011
Medvedev VV, Yakshin AE, van de Kruijs RWE, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F.  2011.  Infrared suppression by hybrid EUV multilayer-IR etalon structures. Optics Letters. 36:3344-3346. Abstract
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RWE, Boekhout F, Gullikson E, Gaudin J et al..  2011.  Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics Letters. 36:3386-3388. Abstract
Makhotkin IA, Louis E, van de Kruijs RWE, Yakshin AE, Zoethout E, Seregin AY, Tereschenko EY, Yakunin SN, Bijkerk F.  2011.  Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi a-Applications and Materials Science. 208:2597-2600. Abstract
Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2011.  In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science. 257:2707-2711. Abstract
2010
Tsarfati T, van de Kruijs RWE, Zoethout E, Louis E, Bijkerk F.  2010.  Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films. 518:7249-7252. Abstract
de Rooij-Lohmann V, Veldhuizen LW, Zoethout E, Yakshin AE, van de Kruijs RWE, Thijsse BJ, Gorgoi M, Schafers F, Bijkerk F.  2010.  Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics. 108:6. Abstract
de Rooij-Lohmann V, Yakshin AE, van de Kruijs RWE, Zoethout E, Kleyn AW, Keim EG, Gorgoi M, Schafers F, Brongersma HH, Bijkerk F.  2010.  Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics. 108:5. Abstract
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RWE, Jurek M, Klinger D, Pelka JB, Juha L et al..  2010.  Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express. 18:700-712. Abstract
Bruijn S, van de Kruijs RWE, Yakshin AE, Zoethout E, Bijkerk F.  2010.  Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology. 205:2469-2473. Abstract
Kuznetsov AS, van de Kruijs RWE, Gleeson MA, Schmid K, Bijkerk F.  2010.  Hydrogen interaction with EUVL-relevant optical materials. Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. 4:563-566. Abstract
2009
Nedelcu I, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2009.  Microstructure of Mo/Si multilayers with B4C diffusion barrier layers. Applied Optics. 48:155-160. Abstract
Tsarfati T, Zoethout E, van de Kruijs RWE, Bijkerk F.  2009.  Atomic O and H exposure of C-covered and oxidized d-metal surfaces. Surface Science. 603:2594-2599. Abstract
Gou F, Gleeson MA, Kleyn AW, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2009.  Growth of silicon nitride films by bombarding amorphous silicon with N+ ions: MD simulation. :3245-3248. Abstract
2007
Nedelcu I, van de Kruijs RWE, Yakshin AE, Bijkerk F.  2007.  Temperature-dependent nanocrystal formation in Mo/Si multilayers. Physical Review B. 76
2006
van de Kruijs RWE, Zoethout E, Yakshin AE, Nedelcu I, Louis E, Enkisch H, Sipos G, Mullender S, Bijkerk F.  2006.  Nano-size crystallites in Mo/Si multilayer optics. Thin Solid Films. 515:430-433.