@article{7103,
  author = {A. J. Nelson and S. Toleikis and H. Chapman and S. Bajt and J. Krzywinski and J. Chalupsky and L. Juha and J. Cihelka and V. Hajkova and L. Vysin and T. Burian and M. Kozlova and R. R. Faustlin and B. Nagler and S. M. Vinko and T. Whitcher and T. Dzelzainis and O. Renner and K. Saksl and A. R. Khorsand and P. A. Heimann and R. Sobierajski and D. Klinger and M. Jurek and J. Pelka and B. Iwan and J. Andreasson and N. Timneanu and M. Fajardo and J. S. Wark and D. Riley and T. Tschentscher and J. Hajdu and R. W. Lee},
  title = {Soft x-ray free electron laser microfocus for exploring matter under extreme conditions},
  abstract = {We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of },
  year = {2009},
  journal = {Optics Express},
  volume = {17},
  number = {20},
  pages = {18271-18278},
  month = {Sep},
  isbn = {1094-4087},
  url = {<Go to ISI>://000270295300112 },
  note = {ISI Document Delivery No.: 500JPTimes Cited: 0Cited Reference Count: 16},
  language = {English},
}