@article{7159,
  author = {J. Chalupsky and J. Krzywinski and L. Juha and V. Hajkova and J. Cihelka and T. Burian and L. Vysin and J. Gaudin and A. Gleeson and M. Jurek and A. R. Khorsand and D. Klinger and H. Wabnitz and R. Sobierajski and M. Stormer and K. Tiedtke and S. Toleikis},
  title = {Spot size characterization of focused non-Gaussian X-ray laser beams},
  abstract = {We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds. (C) 2010 Optical Society of America},
  year = {2010},
  journal = {Optics Express},
  volume = {18},
  number = {26},
  pages = {27836-27845},
  month = {Dec},
  isbn = {1094-4087},
  url = {<Go to ISI>://000285584200115 },
  note = {ISI Document Delivery No.: 698HFTimes Cited: 0Cited Reference Count: 19},
  language = {English},
}