@article{7235,
  author = {I.G.J. Classen and J. E. Boom and W. Suttrop and E. Schmid and B. Tobias and C.W. Domier and N C Luhmann Jr. and A. J. H. Donne and R. J. E. Jaspers and P. C. de Vries and H. K. Park and T. Munsat and M. García-Muñoz and P. A. Schneider},
  title = {2D electron cyclotron emission imaging at ASDEX Upgrade (invited)},
  abstract = {The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfven eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3483214]},
  year = {2010},
  journal = {Review of Scientific Instruments},
  volume = {81},
  number = {10},
  pages = {6},
  month = {Oct},
  isbn = {0034-6748},
  url = {<Go to ISI>://000283754000149 },
  note = {ISI Document Delivery No.: 674NQTimes Cited: 3Cited Reference Count: 17},
  language = {English},
}