@article{7532,
  author = {J. Gaudin and C. Ozkan and J. Chalupsky and S. Bajt and T. Burian and L. Vysin and N. Coppola and S. D. Farahani and H. N. Chapman and G. Galasso and V. Hajkova and M. Harmand and L. Juha and M. Jurek and R. A. Loch and S. Möller and M. Nagasono and M. Stormer and H. Sinn and K. Saksl and R. Sobierajski and J. Schulz and P. Sovak and S. Toleikis and K. Tiedtke and T. Tschentscher and J. Krzywinski},
  title = {Investigating the interaction of x-ray free electron laser radiation with grating structure},
  abstract = {The interaction of free electron laser pulses with grating structure is investigated using 4.6 +/- 0.1 nm radiation at the FLASH facility in Hamburg. For fluences above 63.7 +/- 8.7 mJ/cm(2), the interaction triggers a damage process starting at the edge of the grating structure as evidenced by optical and atomic force microscopy. Simulations based on solution of the Helmholtz equation demonstrate an enhancement of the electric field intensity distribution at the edge of the grating structure. A procedure is finally deduced to evaluate damage threshold. (C) 2012 Optical Society of America},
  year = {2012},
  journal = {Optics Letters},
  volume = {37},
  pages = {3033-3035},
  month = {Aug},
  isbn = {0146-9592},
  doi = {10.1364/OL.37.003033},
  language = {English},
}