@article{7606,
  author = {C. J. Lee and K. J. Boller},
  title = {The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles},
  abstract = {With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection. (c) 2012 Optical Society of America},
  year = {2012},
  journal = {Optics Express},
  volume = {20},
  pages = {12793-12798},
  month = {Jun},
  isbn = {1094-4087},
  doi = {10.1364/OE.20.012793},
  language = {English},
}