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Journal Article
P.CM Planken, H.PM Pellemans, P.C van Son, J.N Hovenier, T.O Klaassen, W.T Wenckebach, P.W Barmby, J.L Dunn, C.A Bates, C.T Foxon et al.,  Using far-infrared two-photon excitation to measure the resonant-polaron effect in the Reststrahlen band of GaAs:Si, Optics Communications 3-4124 (1996) 258-262.