Reiser, D., Brenzke, M., & Wiesen, S. (2024). Parameter identification by eigenfeature analysis: application to 2D Kuramoto-Sivashinsky surface models. Surface Topography: Metrology and Properties, 12(3), 035029. https://doi.org/10.1088/2051-672X/ad6b3d (Original work published 2024)
DIFFER