High sensitivity imaging Thomson scattering for low temperature plasma

TitleHigh sensitivity imaging Thomson scattering for low temperature plasma
Publication TypeJournal Article
Year of Publication2008
AuthorsH.J van der Meiden, R.S. Al, C.J Barth, A.JH Donne, R. Engeln, W.J Goedheer, B. de Groot, A.W Kleyn, W.R Koppers, N.JL Cardozo, M.J. van de Pol, P.R Prins, D.C. Schram, A.E Shumack, P.HM Smeets, W.AJ Vijvers, J. Westerhout, G.M Wright, G.J van Rooij
JournalReview of Scientific Instruments
Date PublishedJan
Type of ArticleArticle
ISBN Number0034-6748
Accession NumberISI:000252821800018
Keywordsdivertor, ITER, SYSTEM, TOKAMAK

A highly sensitive imaging Thomson scattering system was developed for low temperature (0.1-10 eV) plasma applications at the Pilot-PSI linear plasma generator. The essential parts of the diagnostic are a neodymium doped yttrium aluminum garnet laser operating at the second harmonic (532 nm), a laser beam line with a unique stray light suppression system and a detection branch consisting of a Littrow spectrometer equipped with an efficient detector based on a "Generation III" image intensifier combined with an intensified charged coupled device camera. The system is capable of measuring electron density and temperature profiles of a plasma column of 30 mm in diameter with a spatial resolution of 0.6 mm and an observational error of 3% in the electron density (n(e)) and 6% in the electron temperature (T-e) at n(e)=4 x 10(19) m(-3). This is achievable at an accumulated laser input energy of 11 J (from 30 laser pulses at 10 Hz repetition frequency). The stray light contribution is below 9 x 10(17) m(-3) in electron density equivalents by the application of a unique stray light suppression system. The amount of laser energy that is required for a n(e) and T-e measurement is 7 x 10(20)/n(e) J, which means that single shot measurements are possible for n(e)>2 x 10(21) m(-3). (C) 2008 American Institute of Physics.

URL<Go to ISI>://000252821800018

Fusion Physics



Alternate TitleRev. Sci. Instrum.

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