Spot size characterization of focused non-Gaussian X-ray laser beams

TitleSpot size characterization of focused non-Gaussian X-ray laser beams
Publication TypeJournal Article
Year of Publication2010
AuthorsJ. Chalupsky, J. Krzywinski, L. Juha, V. Hajkova, J. Cihelka, T. Burian, L. Vysin, J. Gaudin, A. Gleeson, M. Jurek, A.R Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Stormer, K. Tiedtke, S. Toleikis
JournalOptics Express
Volume18
Number26
Pagination27836-27845
Date PublishedDec
Type of ArticleArticle
ISBN Number1094-4087
Accession NumberISI:000285584200115
Keywordsfree-electron laser, RADIATION
Abstract

We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds. (C) 2010 Optical Society of America

URL<Go to ISI>://000285584200115
Division

nSI

PID

952fe9c18112c018c93a273ee1e2dc79

Alternate TitleOpt. Express

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