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E. Galtier, F.B Rosmej, T. Dzelzainis, D. Riley, F.Y Khattak, P. Heimann, R.W Lee, A.J Nelson, S.M Vinko, T. Whitcher et al.Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses, Phys. Rev. Lett. 106 (2011) 164801.
S.D Farahani, J. Chalupsky, T. Burian, H. Chapman, A.J Gleeson, V. Hajkoya, L. Juha, M. Jurek, D. Klinger, H. Sinn et al.Damage threshold of amorphous carbon mirror for 177 eV FEL radiation, Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip. 635 (2011) S39-S42.
B. Iwan, J. Andreasson, A. Andrejczuk, E. Abreu, M. Bergh, C. Caleman, A.J Nelson, S. Bajt, J. Chalupsky, H.N Chapman et al.TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions, High Energy Density Phys. 7 (2011) 336-342.
R. Sobierajski, S. Bruijn, A.R Khorsand, E. Louis, R de Kruijs, T. Burian, J. Chalupsky, J. Cihelka, A. Gleeson, J. Grzonka et al.Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources, Opt. Express 119 (2011) 193-205.
R.A Loch, A. Dubrouil, R. Sobierajski, D. Descamps, B. Fabre, P. Lidon, R.WE van de Kruijs, F. Boekhout, E. Gullikson, J. Gaudin et al.Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements, Opt. Lett. 36 (2011) 3386-3388.