Publications

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Journal Article
N. Leick, J.W Weber, A.JM Mackus, M.J Weber, M.CM van de Sanden, W.MM KesselsErratum: In situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd (2016 J. Phys. D: Appl. Phys . 49 115504), J. Phys. D: Appl. Phys. 49 (2016) 269601.
J.W Weber, A.A Bol, M.CM van de SandenAn improved thin film approximation to accurately determine the optical conductivity of graphene from infrared transmittance, Applied Physics Letters 1105 (2014) 013105.
N. Leick, J.W Weber, A.JM Mackus, M.J Weber, M.CM van de Sanden, W.MM KesselsIn situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd, J. Phys. D: Appl. Phys. 49 (2016) 115504.
J.W Weber, K. Hinrichs, M. Gensch, M.CM van de Sanden, T.WH OatesMicrofocus infrared ellipsometry characterization of air-exposed graphene flakes, Appl. Phys. Lett. 99 (2011) 3.
H.T Beyene, J.W Weber, M.A Verheijen, M.CM van de Sanden, M. CreatoreReal time in situ spectroscopic ellipsometry of the growth and plasmonic properties of au nanoparticles on SiO2, Nano Res. 5 (2012) 513-520.
D. Sahin, A. Gaggero, J.W Weber, I. Agafonov, M.A Verheijen, F. Mattioli, J. Beetz, M. Kamp, S. Hofling, M.CM van de Sanden et al.Waveguide Nanowire Superconducting Single-Photon Detectors Fabricated on GaAs and the Study of Their Optical Properties, IEEE J. Sel. Top. Quant. Electron. 221 (2015) 3800210.