Publications

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Journal Article
A.FG van der Meer, M.J van der WielMid-IR FEL user facility FELIX, Applied Spectroscopy 451 (1997) 574-575.
R. Schlatmann, C. Lu, J. Verhoeven, E.J Puik, M.J van der WielModification by Ar and Kr Ion-Bombardment of Mo/Si X-Ray Multilayers, Applied Surface Science 278 (1994) 147-157.
A.A Varfolomeev, S.N Ivanchenkov, A.S Khlebnikov, N.S Osmanov, M.J van der Wiel, W.H Urbanus, V.F PavluchenkovPerformance of the Undulator for the Fom-Fem Project, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3341 (1994) 466-469.
M. Caplan, R.WB Best, A.GA Verhoeven, M.J van der Wiel, W.H Urbanus, V.L Bratman, G.G DenisovPredicted Performance of a Dc Beam Driven Fem Oscillator Designed for Fusion Applications at 200-250 Ghz, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3331 (1993) 243-249.
H. Vanbrug, M.J van der Wiel, R. Vanderpol, J. Verhoeven, G. Vanderlaan, J.B GoedkoopReflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings, Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 46 (1988) 2182-2187.
M.J van der Wiel, P.W van AmersfoortA Role for Free-Electron Lasers in Fusion, Fusion Engineering and Design 1-211 (1989) 245-253.
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. VerhoevenThe Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors, Vacuum 8-1038 (1988) 707-709.
H. Vanbrug, G.E van Dorssen, M.J van der WielSi L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers), Surface Science 1-2210 (1989) 69-84.
A.V Tulupov, M.J van der Wiel, W.H Urbanus, M. CaplanSimulations of the Performance of the Fem Oscillator for Fusion at 130-250 Ghz, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3341 (1994) 305-308.
E. Louis, F. Bijkerk, L. Shmaenok, H.J Voorma, M.J van der Wiel, R. Schlatmann, J. Verhoeven, E.WJM van der Drift, J. Romijn, B.AC Rousseeuw et al.Soft-X-Ray Projection Lithography Using a High-Repetition-Rate Laser-Induced X-Ray Source for Sub-100 Nanometer Lithography Processes, Microelectronic Engineering 1-421 (1993) 67-70.
P.W van Amersfoort, R.WB Best, R. Vanbuuren, P.FM Delmee, B. Faatz, C.AJ van der Geer, D.A Jaroszynski, P. Manintveld, W.J Mastop, B.JH Meddens et al.Status and Research Objectives of the Dutch Free-Electron Laser for Infrared Experiments, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3296 (1990) 217-221.
W.H Urbanus, W.A Bongers, G. van Dijk, C.AJ van der Geer, S. de Kroon, P. Manintveld, J. Pluygers, A.B Sterk, M. Valentini, A.GA Verhoeven et al.Status, commissioning of the 1 MW, 130-260 GHz fusion-FEM, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3375 (1996) 401-402.
P.W van Amersfoort, R.WB Best, B. Faatz, C.AJ van der Geer, W.J Mastop, B.JH Meddens, A.FG van der Meer, D. Oepts, M.J van der WielStatus of the Dutch Free-Electron Laser for Infrared Experiments, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-2285 (1989) 67-70.
Y. Pinhasi, A. Gover, R.WB Best, M.J van der WielTransverse-Mode Excitation and Coupling in a Wave-Guide Free-Electron Laser, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3318 (1992) 523-527.
P.W van Amersfoort, R.J Bakker, J.B Bekkers, R.WB Best, R. Vanbuuren, P.FM Delmee, B. Faatz, C.AJ van der Geer, P. Hellingman, D.A Jaroszynski et al.Update on Felix, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3304 (1991) 163-167.
J. Verhoeven, H. Zeijlemaker, E.J Puik, M.J van der WielOn the Use of H+ and Ar+ Ions for High Spatial-Resolution Depth Profiling, Vacuum 4-641 (1990) 1327-1329.

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