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G. von Helden, I. Holleman, A.JA van Roij, G.M.H. Knippels, A.FG van der Meer, G. MeijerShedding new light on thermionic electron emission of fullerenes, Physical Review Letters 981 (1998) 1825-1828.
G. von Helden, D. van Heijnsbergen, M.A Duncan, G. MeijerIR-REMPI of vanadium-carbide nanocrystals: Ideal versus truncated lattices, Chemical Physics Letters 5333 (2001) 350-357.
M. von Hellermann, R. Jaspers, W. Biel, A. Litnovsky, O. Neubauer, M. Pap, N.C Hawkes, C. Marren, B. Walton, Y. Kaschuck et al.Status of the DNB based ITER CXRS and BES diagnostic, Review of Scientific Instruments 1077 (2006) 
M. von Hellermann, M. De Bock, R. Jaspers, K. Jakubowska, R. Barnsley, C. Giroud, N.C Hawkes, K.D Zastrow, P. Lotte, R. Giannella et al.Pilot experiments for the International Thermonuclear Experimental Reactor active beam spectroscopy diagnostic, Review of Scientific Instruments 1075 (2004) 3458-3461.
M.G von Hellermann, R. Barnsley, W. Biel, E. Delabie, N. Hawkes, R. Jaspers, D. Johnson, F. Klinkhamer, O. Lischtschenko, O. Marchuk et al.Active beam spectroscopy for ITER, Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip. 2623 (2010) 720-725.
M.G von Hellermann, G. Bertschinger, W. Biel, C. Giroud, R. Jaspers, C. Jupen, O. Marchuk, M. O'Mullane, H.P Summers, A. Whiteford et al.Complex spectra in fusion plasmas, Physica Scripta T120 (2005) 19-29.
C.P.Pérez von ThunMHD analysis of edge instabilities in the JET tokamak, PhD (2004) 
H.J Voorma, E. Louis, N.B Koster, F. Bijkerk, T. Zijlstra, L.EM de Groot, B.AC Rousseeuw, J. Romijn, E.WJM van der Drift, J. FriedrichFabrication and analysis of extreme ultraviolet reflection masks with patterned W/C absorber bilayers, Journal of Vacuum Science & Technology B 215 (1997) 293-298.
H.J Voorma, E. Louis, N.B Koster, F. Bijkerk, E. SpillerCharacterization of multilayers by Fourier analysis of x-ray reflectivity, Journal of Applied Physics 981 (1997) 6112-6119.
H.J Voorma, G.E van Dorssen, E. Louis, N.B Koster, A.D Smith, M.D Roper, F. BijkerkEXAFS measurements on the structure of Mo/Si multilayers produced using ion bombardment and increased deposition temperature, Applied Surface Science 393 (1996) 221-230.
H.J Voorma, F. BijkerkDesign of an Extended Image Field Soft-X-Ray Projection System, Microelectronic Engineering 1-417 (1992) 145-148.
H.J Voorma, E. Louis, N.B Koster, F. BijkerkTemperature induced diffusion in Mo/Si multilayer mirrors, Journal of Applied Physics 983 (1998) 4700-4708.
H.J Voorma, E. Louis, F. Bijkerk, S. AbdaliAngular and energy dependence of ion bombardment of Mo/Si multilayers, Journal of Applied Physics 482 (1997) 1876-1881.
D. Wagner, W. Kasparek, G. Gantenbein, M.E Manso, J. Sanchez, A.JH DonneTransmission line studies for ITER compatible reflectometers, Review of Scientific Instruments 168 (1997) 431-434.
D. Wagner, W. Bongers, W. Kasparek, F. Leuterer, F. Monaco, M. Münich, H. Schütz, J. Stober, M. Thumm, H. van de BrandA Multifrequency Notch Filter for Millimeter Wave Plasma Diagnostics based on Photonic Bandgaps in Corrugated Circular Waveguides, EPJ Web Conf. 87 (2015) 04012.
A.J Walsh, R. van Lent, S.V Auras, M.A Gleeson, O.T Berg, L.BF JuurlinkStep-type and step-density influences on CO adsorption probed by reflection absorption infrared spectroscopy using a curved Pt(1 1 1) surface, J. Vac. Sci. Technol. A 35 (2017) 03E102.
OA PDF icon 2017_66745.pdf (1.11 MB)
M.J Walsh, E.R Arends, P.G Carolan, M.R. Dunstan, M.J. Forrest, S.K. Nielsen, R. O'GormanCombined visible and infrared Thomson scattering on the MAST experiment, Review of Scientific Instruments 374 (2003) 1663-1666.
C.M Wang, J.P GoedbloedMagnetically tapered plasma channels for laser wakefield accelerators, J. Phys. D-Appl. Phys. 841 (2008) 9.
S.J Wang, Q. Le-Van, F. Vaianella, B. Maes, E S. Barker, R.H Godiksen, A.G Curto, J Gomez RivasLimits to Strong Coupling of Excitons in Multilayer WS2 with Collective Plasmonic Resonances, ACS Photonics 6 (2019) 286-293.
S.J Wang, Q. Le-Van, T. Peyronel, M. Ramezani, N. van Hoof, T.G Tiecke, J Gomez RivasPlasmonic Nanoantenna Arrays as Efficient Etendue Reducers for Optical Detection, ACS Photonics 5 (2018) 2478-2485.