Export 3195 results:
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F. Bijkerk, L. Shmaenok, A. Vanhonk, R. Bastiaensen, Y.Y Platonov, A.P Shevelko, A.V Mitrofanov, F. Voss, R. Desor, H. Frowein et al.Laser-Plasma Sources for Soft-X-Ray Projection Lithography, Journal De Physique Iii 94 (1994) 1669-1677.
F. Bijkerk, L.A Shmaenok, E. Louis, H.J Voorma, N.B Koster, C. Bruineman, R Bastiaensen, E.WJM van der Drift, J. Romijn, L.EM de Groot et al.Extreme UV lithography: A new laser plasma target concept and fabrication of multilayer reflection masks, Microelectronic Engineering 1-430 (1996) 183-186.
F. BijkerkDevelopment of multilayer coatings and spin-off to XRL applications, Journal De Physique Iv PR211 (2001) 509-510.
W. Biel, R. Albanese, R. Ambrosino, M. Ariola, M. van Berkel, I. Bolshakova, K.J Brunner, R. Cavazzana, M. Cecconello, S. Conroy et al.Diagnostics for plasma control - From ITER to DEMO, Fusion Eng. Des. 146 (2019) 465-472.
W. Biel, T. Baross, P. Bourauel, D. Dunai, M. Durkut, G. Erdei, N. Hawkes, M. von Hellermann, A. Hogenbirk, R. Jaspers et al.Overview on R&D and design activities for the ITER core charge exchange spectroscopy diagnostic system, Fusion Eng. Des. 86 (2011) 548-551.
W. Biel, M. de Baar, A. Dinklage, F. Felici, R. Konig, H. Meister, W. Treutterer, R. WenningerDEMO diagnostics and burn control, Fusion Eng. Des. 96–97 (2015) 8-15.
A. Bieberle, I. Tanyeli, R. Lavrijsen, B. Koopmans, R. Sinha, M.CM van de SandenNanostructuring of iron thin films by high flux low energy helium plasma, Thin Solid Films 631 (2017) 50-56.
OA PDF icon 2017_66814.pdf (1.89 MB)
A.C.W. Biebericher, W.F. van der Weg, J.K. Rath, M.R. Akdim, W.J GoedheerGas-efficient deposition of device-quality hydrogenated amorphous silicon using low gas flows and power modulated radio-frequency discharges, Journal of Vacuum Science & Technology A 121 (2003) 156-166.
A.C.W. Biebericher, J. Bezemer, W.F. van der Weg, W.J GoedheerDeposition rate in modulated radio-frequency silane plasmas, Applied Physics Letters 1576 (2000) 2002-2004.
A.C.W. Biebericher, W.F. van der Weg, W.J Goedheer, J.K. RathMechanism of argon treatment on a growing surface in layer-by-layer deposition of hydrogenated amorphous silicon, Journal of Non-Crystalline Solids 299 (2002) 74-78.
A. Bhattacharya, G. Georgiou, S. Sawallich, C. Matheisen, M. Nagel, J Gomez RivasLarge near-to-far field spectral shifts for terahertz resonances, Phys. Rev. B 93 (2016) 035438.
OA PDF icon 2016_64396.pdf (1.11 MB)
A. BhattacharyaTerahertz Micro-resonators Investigated in the Near- and Far-field, PhD (2017) 
A. Bhattacharya, J Gomez RivasFull vectorial mapping of the complex electric near-fields of THz resonators, APL Photonics 1 (2016) 086103.
H.T Beyene, F.D Tichelaar, M.A Verheijen, M.CM van de Sanden, M. CreatorePlasma-Assisted Deposition of Au/SiO2 Multi-layers as Surface Plasmon Resonance-Based Red-Colored Coatings, Plasmonics 6 (2011) 255-260.
H.T Beyene, J.W Weber, M.A Verheijen, M.CM van de Sanden, M. CreatoreReal time in situ spectroscopic ellipsometry of the growth and plasmonic properties of au nanoparticles on SiO2, Nano Res. 5 (2012) 513-520.
M.NA Beurskens, C.J Barth, C.C. Chu, A.JH Donne, J.A Herranz, N.JL Cardozo, H.J van der Meiden, F.J. PijperDouble pulse Thomson scattering system at RTP, Review of Scientific Instruments 168 (1997) 721-724.
M.NA Beurskens, C.J Barth, N.JL Cardozo, H.J van der Meiden, R. T. P. TeamStructures in T-e profiles: High resolution Thomson scattering in the Rijnhuizen tokamak project, Review of Scientific Instruments 170 (1999) 995-997.
M.NA Beurskens, L. Frassinetti, C. Challis, C. Giroud, S. Saarelma, B. Alper, C. Angioni, P. Bilkova, C. Bourdelle, S. Brezinsek et al.Global and pedestal confinement in JET with a Be/W metallic wall, Nucl. Fusion 54 (2014) 043001.
M.NA Beurskens, C.J Barth, C.C. Chu, N.JL CardozoError analysis of Rijnhuizen tokamak project Thomson scattering data, Review of Scientific Instruments 470 (1999) 1999-2011.
M.NA Beurskens, N.JL Cardozo, E.R Arends, C.J Barth, H.J van der MeidenFilamentation in the RTP tokamak plasma, Plasma Physics and Controlled Fusion 143 (2001) 13-38.