Publications

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Journal Article
A.JR van den Boogaard, E. Zoethout, I.A Makhotkin, E. Louis, F. Bijkerk,  Influence of noble gas ion polishing species on extreme ultraviolet mirrors, J. Appl. Phys. 12112 (2012) 123502.
V.V Medvedev, A.E Yakshin, R.WE van de Kruijs, V.M Krivtsun, A.M Yakunin, K.N Koshelev, F. Bijkerk,  Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors, Opt. Lett. 37 (2012) 1169-1171.
V.V Medvedev, A.JR van den Boogaard, R. van der Meer, A.E Yakshin, E. Louis, V.M Krivtsun, F. Bijkerk,  Infrared diffractive filtering for extreme ultraviolet multilayer Bragg reflectors, Opt. Express 1421 (2013) 16964-16974.
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V.V Medvedev, A.E Yakshin, R.WE van de Kruijs, V.M Krivtsun, A.M Yakunin, K.N Koshelev, F. Bijkerk,  Infrared suppression by hybrid EUV multilayer-IR etalon structures, Opt. Lett. 36 (2011) 3344-3346.
S. Bruijn, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films, Appl. Surf. Sci. 257 (2011) 2707-2711.
J. Bosgra, L.W Veldhuizen, E. Zoethout, J. Verhoeven, R.A Loch, A.E Yakshin, F. Bijkerk,  Interactions of C in layered Mo-Si structures, Thin Solid Films 542 (2013) 210-213.
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I. Nedelcu, R de Kruijs, A.E Yakshin, F. Tichelaar, E. Zoethout, E. Louis, H. Enkisch, S. Muellender, F. Bijkerk,  Interface roughness in Mo/Si multilayers, Thin Solid Films 2515 (2006) 434-438.
S.L Nyabero, R.WE van de Kruijs, A.E Yakshin, E. Zoethout, G. von Blanckenhagen, J. Bosgra, R.A Loch, F. Bijkerk,  Interlayer growth in Mo/B4C multilayered structures upon thermal annealing, J. Appl. Phys. 113 (2013) 144310.
S. Bruijn, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures, J. Appl. Phys. 111 (2012) 064303.
M.JH Kessels, J. Verhoeven, A.E Yakshin, F.D Tichelaar, F. Bijkerk,  Ion beam induced intermixing of interface structures in W/Si multilayers, Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 3-4222 (2004) 484-490.
A.S Kuznetsov, M.A Gleeson, F. Bijkerk,  Ion effects in hydrogen-induced blistering of Mo/Si multilayers, J. Appl. Phys. 114 (2013) 113507.
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M.JH Kessels, J. Verhoeven, F.D Tichelaar, F. Bijkerk,  Ion-induced interface layer formation in W/Si and WRe/Si multilayers, Surface Science 1-3582 (2005) 227-234.
F. Bijkerk, L. Shmaenok, A. Vanhonk, R. Bastiaensen, Y.Y Platonov, A.P Shevelko, A.V Mitrofanov, F. Voss, R. Desor, H. Frowein et al.,  Laser-Plasma Sources for Soft-X-Ray Projection Lithography, Journal De Physique Iii 94 (1994) 1669-1677.
F. Bijkerk,  Laser-Plasma Xuv Sources, Advances in Performance, Institute of Physics Conference Series 130 (1993) 471-477.
R. Stuik, F. Bijkerk,  Linearity of P-N junction photodiodes under pulsed irradiation, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 1-3489 (2002) 370-378.
H. Vanbrug, F. Bijkerk, M.J van der Wiel, B. Vanwingerden,  Low-Z Element Analysis by Soft-X-Ray Line Emission of a Laser-Produced Plasma, Journal of Analytical Atomic Spectrometry 52 (1987) 503-507.
I. Nedelcu, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  Microstructure of Mo/Si multilayers with B4C diffusion barrier layers, Appl. Optics 248 (2009) 155-160.
S.N Yakunin, I.A Makhotkin, R.WE van de Kruijs, M.A Chuev, E.M. Pashaev, E. Zoethout, E. Louis, Y S. Seregin, I.A. Subbotin, D.V Novikov et al.,  Model independent X-ray standing wave analysis of periodic multilayer structures, J. Appl. Phys. 115 (2014) 134303.
R.A Loch, R. Sobierajski, E. Louis, J. Bosgra, F. Bijkerk,  Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sources, Opt. Express 2720 (2012) 28200–28215.
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R. Sobierajski, R.A Loch, R.WE van de Kruijs, E. Louis, G. von Blanckenhagen, E.M Gullikson, F. Siewert, A. Wawro, F. Bijkerk,  Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources, J. Synchrotron Rad. 20 (2013) 249-257.
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