Publications

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Author Title [ Type(Desc)] Year
Filters: Author is van de Kruijs, R. W. E.  [Clear All Filters]
Journal Article
J. Bosgra, J. Verhoeven, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  Non-constant diffusion characteristics of nanoscopic Mo-Si interlayer growth, Thin Solid Films 522 (2012) 228–232.
R.A Loch, A. Dubrouil, R. Sobierajski, D. Descamps, B. Fabre, P. Lidon, R.WE van de Kruijs, F. Boekhout, E. Gullikson, J. Gaudin et al.,  Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements, Opt. Lett. 36 (2011) 3386-3388.
A.R Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E.D van Hattum, R.WE van de Kruijs, M. Jurek, D. Klinger, J.B Pelka, L. Juha et al.,  Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure, Opt. Express 218 (2010) 700-712.
J. Bosgra, E. Zoethout, A.MJ van der Eerden, J. Verhoeven, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors, Appl. Opt. 3651 (2012) 8541-8548.
S.P Huber, R.WE van de Kruijs, A.E Yakshin, E. Zoethout, K.-J. Boller, F. Bijkerk,  Subwavelength single layer absorption resonance antireflection coatings, Opt. Express 122 (2014) 490–497.
OA 
I. Nedelcu, R.WE van de Kruijs, A.E Yakshin, F. Bijkerk,  Temperature-dependent nanocrystal formation in Mo/Si multilayers, Physical Review B 2476 (2007) 
S. Bruijn, R.WE van de Kruijs, A.E Yakshin, E. Zoethout, F. Bijkerk,  Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures, Surf. Coat. Technol. 7205 (2010) 2469-2473.
S.L Nyabero, R.WE van de Kruijs, A.E Yakshin, E. Zoethout, F. Bijkerk,  Thermally induced interface chemistry in Mo/B4C/Si/B4C multilayered films, J. Appl. Phys. 112 (2012) 054317.

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