Publications

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Journal Article
M.JH Kessels, F. Bijkerk, F.D Tichelaar, J. Verhoeven,  Determination of in-depth density profiles of multilayer structures, Journal of Applied Physics 997 (2005) 
E.J Puik, G.E van Dorssen, M.J van der Wiel, J. Verhoeven, G. Vanderlaan, H.A Padmore,  Characterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev, Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 69 (1991) 3142-3148.
S. Dobrovolskiy, A.E Yakshin, M.JH Kessels, J. Verhoeven,  The application of energetic CHx+ ions to form a Si/SiC multilayer system for reflection of radiation between 20 and 80 nm, Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 3-4237 (2005) 533-542.

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