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T. Putterich, R. Dux, R. Neu, M. Bernert, M.NA Beurskens, V. Bobkov, S. Brezinsek, C. Challis, J.W Coenen, I. Coffey et al.Observations on the W-transport in the core plasma of JET and ASDEX Upgrade, Plasma Phys. Control. Fusion 1255 (2013) 124036.
J.W Pustjens, J.P Friconneau, C.JM Heemskerk, J.F Koning, J.P Martins, P Rosielle, M. SteinbuchITER Upper Port Plug handling cask system assessment and design proposals, Fusion Eng. Des. 9-1186 (2011) 1937-1940.
M.J Puschel, B.J Faber, J. Citrin, C.C Hegna, P.W Terry, D.R HatchStellarator Turbulence: Subdominant Eigenmodes and Quasilinear Modeling, Phys. Rev. Lett. 116 (2016) 085001.
D. Purohit, T. Bigelow, D. Billava, T. Bonicelli, J. Caughman, C. Darbos, G. Denisov, F. Gandini, T. Gassmann, M. Henderson et al.An overview of control system for the ITER electron cyclotron system, Fusion Eng. Des. 6-886 (2011) 959-962.
F.J Puik, M.J van der Wiel, H. Zeijlemaker, J. VerhoevenIon Etching of Thin W-Layers - Enhanced Reflectivity of W-C Multilayer Coatings, Applied Surface Science 147 (1991) 63-76.
E.J Puik, G.E van Dorssen, M.J van der Wiel, J. Verhoeven, G. Vanderlaan, H.A PadmoreCharacterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev, Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 69 (1991) 3142-3148.
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. VerhoevenIon-Bombardment of Thin-Layers - the Effect on the Interface Roughness and Its X-Ray Reflectivity, Review of Scientific Instruments 163 (1992) 1415-1419.
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. VerhoevenThe Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors, Vacuum 8-1038 (1988) 707-709.
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. VerhoevenIon-Bombardment of X-Ray Multilayer Coatings - Comparison of Ion Etching and Ion Assisted Deposition, Applied Surface Science 347 (1991) 251-260.
M.E Puiatti, M. Mattioli, G. Telesca, M. Valisa, I. Coffey, P. Dumortier, C. Giroud, L.C Ingesson, K.D Lawson, G. Maddison et al.Radiation pattern and impurity transport in argon seeded ELMy H-mode discharges in JET, Plasma Physics and Controlled Fusion 944 (2002) 1863-1878.
H.B Profijt, M.CM van de Sanden, W.MM KesselsSubstrate Biasing during Plasma-Assisted ALD for Crystalline Phase-Control of TiO(2) Thin Films, Electrochem. Solid State Lett. 15 (2012) G1-G3.
H.B Profijt, M.CM van de Sanden, W.MM KesseleSubstrate-biasing during plasma-assisted atomic layer deposition to tailor metal-oxide thin film growth, J. Vac. Sci. Technol. A 31 (2013) 9.
H.B Profijt, S.E Potts, M.CM van de Sanden, W.MM KesselsPlasma-Assisted Atomic Layer Deposition: Basics, Opportunities, and Challenges, J. Vac. Sci. Technol. A 29 (2011) 26.
H.B Profijt, P. Kudlacek, M.CM van de Sanden, W.MM KesselsIon and Photon Surface Interaction during Remote Plasma ALD of Metal Oxides, J. Electrochem. Soc. 158 (2011) G88-G91.
P.A Premkumar, S.A Starostin, H. de Vries, M. Creatore, P.M Koenraad, W.A MacDonald, M.CM van de SandenSurface Dynamics of SiO2-like Films on Polymers Grown by DBD Assisted CVD at Atmospheric Pressure, Plasma Processes Polym. 11-129 (2012) 1194–1207.
P.A Premkumar, S.A Starostin, H. de Vries, M. Creatore, P.M Koenraad, M.CM van de SandenMorphological Description of Ultra-Smooth Organo-Silicone Layers Synthesized Using Atmospheric Pressure Dielectric Barrier Discharge Assisted PECVD, Plasma Processes and Polymers 410 (2013) 313–319.
J.S Prell, T.G Flick, J. Oomens, G. Berden, E.R WilliamsCoordination of Trivalent Metal Cations to Peptides: Results from IRMPD Spectroscopy and Theory, J. Phys. Chem. A 2114 (2010) 854-860.
J.S Prell, J.T O'Brien, J.D Steill, J. Oomens, E.R WilliamsStructures of Protonated Dipeptides: The Role of Arginine in Stabilizing Salt Bridges, J. Am. Chem. Soc. 32131 (2009) 11442-11449.
J.S Prell, M. Demireva, J. Oomens, E.R WilliamsRole of Sequence in Salt-Bridge Formation for Alkali Metal Cationized GlyArg and ArgGly Investigated with IRMPD Spectroscopy and Theory, J. Am. Chem. Soc. 3131 (2009) 1232-1242.
J.S Prell, T.M Chang, J.A Biles, G. Berden, J. Oomens, E.R WilliamsIsomer Population Analysis of Gaseous Ions From Infrared Multiple Photon Dissociation Kinetics, J. Phys. Chem. A 13115 (2011) 2745-2751.

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