Publications

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H.J Voorma, G.E van Dorssen, E. Louis, N.B Koster, A.D Smith, M.D Roper, F. Bijkerk,  EXAFS measurements on the structure of Mo/Si multilayers produced using ion bombardment and increased deposition temperature, Applied Surface Science 393 (1996) 221-230.
H.J Voorma, E. Louis, N.B Koster, F. Bijkerk, T. Zijlstra, L.EM de Groot, B.AC Rousseeuw, J. Romijn, E.WJM van der Drift, J. Friedrich,  Fabrication and analysis of extreme ultraviolet reflection masks with patterned W/C absorber bilayers, Journal of Vacuum Science & Technology B 215 (1997) 293-298.
H.J Voorma, E. Louis, N.B Koster, F. Bijkerk, E. Spiller,  Characterization of multilayers by Fourier analysis of x-ray reflectivity, Journal of Applied Physics 981 (1997) 6112-6119.
H.J Voorma, E. Louis, F. Bijkerk, S. Abdali,  Angular and energy dependence of ion bombardment of Mo/Si multilayers, Journal of Applied Physics 482 (1997) 1876-1881.
H.J Voorma, E. Louis, N.B Koster, F. Bijkerk,  Temperature induced diffusion in Mo/Si multilayer mirrors, Journal of Applied Physics 983 (1998) 4700-4708.
H.J Voorma, F. Bijkerk,  Design of an Extended Image Field Soft-X-Ray Projection System, Microelectronic Engineering 1-417 (1992) 145-148.
C.P.Pérez von Thun,  MHD analysis of edge instabilities in the JET tokamak, PhD (2004) 
M. von Hellermann, M. De Bock, R. Jaspers, K. Jakubowska, R. Barnsley, C. Giroud, N.C Hawkes, K.D Zastrow, P. Lotte, R. Giannella et al.,  Pilot experiments for the International Thermonuclear Experimental Reactor active beam spectroscopy diagnostic, Review of Scientific Instruments 1075 (2004) 3458-3461.
M.G von Hellermann, R. Barnsley, W. Biel, E. Delabie, N. Hawkes, R. Jaspers, D. Johnson, F. Klinkhamer, O. Lischtschenko, O. Marchuk et al.,  Active beam spectroscopy for ITER, Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip. 2623 (2010) 720-725.
M.G von Hellermann, G. Bertschinger, W. Biel, C. Giroud, R. Jaspers, C. Jupen, O. Marchuk, M. O'Mullane, H.P Summers, A. Whiteford et al.,  Complex spectra in fusion plasmas, Physica Scripta T120 (2005) 19-29.
M. von Hellermann, R. Jaspers, W. Biel, A. Litnovsky, O. Neubauer, M. Pap, N.C Hawkes, C. Marren, B. Walton, Y. Kaschuck et al.,  Status of the DNB based ITER CXRS and BES diagnostic, Review of Scientific Instruments 1077 (2006) 
G. von Helden, D. van Heijnsbergen, M.A Duncan, G. Meijer,  IR-REMPI of vanadium-carbide nanocrystals: Ideal versus truncated lattices, Chemical Physics Letters 5333 (2001) 350-357.
G. von Helden, I. Compagnon, M.N Blom, M. Frankowski, U. Erlekam, J. Oomens, B. Brauer, R.B Gerber, G. Meijer,  Mid-IR spectra of different conformers of phenylalanine in the gas phase, Phys. Chem. Chem. Phys. 910 (2008) 1248-1256.
G. von Helden, D. van Heijnsbergen, G. Meijer,  Resonant ionization using IR light: A new tool to study the spectroscopy and dynamics of gas-phase molecules and clusters, Journal of Physical Chemistry A 11107 (2003) 1671-1688.
G. von Helden, I. Holleman, G. Meijer, B. Sartakov,  Excitation of C-60 using a chirped free electron laser, Optics Express 24 (1999) 46-52.
G. von Helden, A Tielens, D. van Heijnsbergen, M.A Duncan, S. Hony, L Waters, G. Meijer,  Titanium carbide nanocrystals in circumstellar environments, Science 5464288 (2000) 313-316.
G. von Helden, I. Holleman, A.JA van Roij, G.M.H. Knippels, A.FG van der Meer, G. Meijer,  Shedding new light on thermionic electron emission of fullerenes, Physical Review Letters 981 (1998) 1825-1828.
G. von Helden, A. Kirilyuk, D. van Heijnsbergen, B. Sartakov, M.A Duncan, G. Meijer,  Infrared spectroscopy of gas-phase zirconium oxide clusters, Chemical Physics 1262 (2000) 31-39.
G. von Helden, I. Holleman, G.M.H. Knippels, A.FG van der Meer, G. Meijer,  Infrared resonance enhanced multiphoton ionization of fullerenes, Physical Review Letters 2679 (1997) 5234-5237.
S. von Goeler, R. Kaita, M. Bitter, G. Fuchs, M. Poier, G. Bertschinger, H.R Koslowski, K. Toi, S. Ohdachi, A. Donné,  High speed tangential soft x-ray camera for the study of magnetohydrodynamics instabilities, Review of Scientific Instruments 170 (1999) 599-602.

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