Deng, B., Domier, C., Luhmann, N. C. , Jr., Brower, D., Cima, G., Donne, A. J. H., … van de Pol, M. (2001). ECE imaging of electron temperature and electron temperature fluctuations (invited). Review of Scientific Instruments, 72, 301-306. https://doi.org/10.1063/1.1319864 (Original work published 2025)
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