DIFFER

F. J. Puik

First name
F.
Middle name
J.
Last name
Puik
Puik, F. J., van der Wiel, M. J., Zeijlemaker, H. ., & Verhoeven, J. . (1991). Ion Etching of Thin W-Layers - Enhanced Reflectivity of W-C Multilayer Coatings. Applied Surface Science, 47, 63-76. (Original work published 2024)