D. C. van der Laan

van der Laan, D. C., Douglas, J. F., Clickner, C. C., Stauffer, T. C., Goodrich, L. F., & van Eck, H. J. N. (2011). Evidence that the reversible strain effect on critical current density and flux pinning in Bi2Sr2Ca2Cu3Ox tapes is caused entirely by the pressure dependence of the critical temperature. Superconductor Science & Technology, 24(3), 032001. https://doi.org/10.1088/0953-2048/24/3/032001 (Original work published 2025)

van der Laan, D. C., Schwartz, J. ., Haken, ten ., Dhalle, M. ., & van Eck, H. J. N. (2008). Limits to the critical current in Bi2Sr2Ca2Cu3Ox tape conductors: The parallel path model. Physical Review B, 77, 14. Retrieved from <Go to ISI>://000254542700110 (Original work published 2025)