DIFFER

C. J. Lee

First name
C.
Middle name
J.
Last name
Lee
Oldenbeuving, R. M., Song, H., Schitter, G., Verhaegen, M., Klein, E. J., Lee, C. J., … Boller, K. J. (2013). High precision wavelength estimation method for integrated optics. Optics Express, 21, 17042–17052. https://doi.org/10.1364/OE.21.017042 (Original work published 2025)
Cleff, C., Groß, P., Fallnich, C., Offerhaus, H. L., Herek, J. L., Kruse, K., … Boller, K.-J. (2013). Stimulated-emission pumping enabling sub-diffraction-limited spatial resolution in coherent anti-Stokes Raman scattering microscopy. Physical Review A, 87, 033830. https://doi.org/10.1103/PhysRevA.87.033830 (Original work published 2025)
Lee, C. J., van der Slot, P. J. M., & Boller, K. J. (2013). A gain-coefficient switched Alexandrite laser. Journal of Physics D-Applied Physics, 46, 015103. https://doi.org/10.1088/0022-3727/46/1/015103 (Original work published 2025)
Gao, A., Rizo, P. J., Zoethout, E., Scaccabarozzi, L., Lee, C. J., Banine, V., & Bijkerk, F. (2013). Extreme ultraviolet induced defects on few-layer graphene. Journal of Applied Physics, 114(4), 044313. https://doi.org/10.1063/1.4817082
Sturm, J. M., Lee, C. J., & Bijkerk, F. (2013). Reactions of ethanol on Ru(0001). Surface Science, 612, 42-47. https://doi.org/10.1016/j.susc.2013.02.009
Liu, F., Lee, C. J., Chen, J. Q., Louis, E., van der Slot, P. J. M., Boller, K. J., & Bijkerk, F. (2012). Ellipsometry with randomly varying polarization states. Optics Express, 20(2), 870-878. https://doi.org/10.1364/OE.20.000870 (Original work published 2025)
Lee, C. J., & Boller, K. J. (2012). The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles. Optics Express, 20(12), 12793-12798. https://doi.org/10.1364/OE.20.012793 (Original work published 2025)
Cleff, C., Groß, P., Fallnich, C., Offerhaus, H. L., Herek, J., Kruse, K., … Boller, K. J. (2012). Ground-state depletion for subdiffraction-limited spatial resolution in coherent anti-Stokes Raman. PHYSICAL REVIEW A, 86, 023825. https://doi.org/10.1103/PhysRevA.86.023825 (Original work published 2012)
Bayraktar, M., Wessels, W., Lee, C. J., Van Goor, F., Koster, G., Rijnders, G., & Bijkerk, F. (2012). Active multilayer mirrors for reflectance tuning at extreme ultraviolet (EUV) wavelengths. Journal of Physics D (Applied Physics), 45, 494001. https://doi.org/10.1088/0022-3727/45/49/494001 (Original work published 2012)
Chen, J. Q., Louis, E., Wormeester, H., Harmsen, R., van de Kruijs, R., Lee, C. J., … Bijkerk, F. (2011). Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology, 22(10), 105705. https://doi.org/10.1088/0957-0233/22/10/105705 (Original work published 2025)