C. J. Lee

Oldenbeuving, R. M., Song, H. ., Schitter, G. ., Verhaegen, M. ., Klein, E. J., Lee, C. J., … Boller, K. J. (2013). High precision wavelength estimation method for integrated optics. Optics Express, 21, 17042–17052. https://doi.org/10.1364/OE.21.017042 (Original work published 2025)

Cleff, C. ., Groß, P. ., Fallnich, C. ., Offerhaus, H. L., Herek, J. L., Kruse, K. ., … Boller, K.-J. . (2013). Stimulated-emission pumping enabling sub-diffraction-limited spatial resolution in coherent anti-Stokes Raman scattering microscopy. Physical Review A, 87, 033830. https://doi.org/10.1103/PhysRevA.87.033830 (Original work published 2025)

Lee, C. J., van der Slot, P. J. M., & Boller, K. J. (2013). A gain-coefficient switched Alexandrite laser. Journal of Physics D-Applied Physics, 46, 015103. https://doi.org/10.1088/0022-3727/46/1/015103 (Original work published 2025)

Gao, A. ., Rizo, P. J., Zoethout, E. ., Scaccabarozzi, L. ., Lee, C. J., Banine, V. ., & Bijkerk, F. . (2013). Extreme ultraviolet induced defects on few-layer graphene. Journal of Applied Physics, 114(4), 044313. https://doi.org/10.1063/1.4817082

Sturm, J. M., Lee, C. J., & Bijkerk, F. . (2013). Reactions of ethanol on Ru(0001). Surface Science, 612, 42-47. https://doi.org/10.1016/j.susc.2013.02.009

Liu, F. ., Lee, C. J., Chen, J. Q., Louis, E. ., van der Slot, P. J. M., Boller, K. J., & Bijkerk, F. . (2012). Ellipsometry with randomly varying polarization states. Optics Express, 20(2), 870-878. https://doi.org/10.1364/OE.20.000870 (Original work published 2025)

Cleff, C. ., Groß, P. ., Fallnich, C. ., Offerhaus, H. L., Herek, J. ., Kruse, K. ., … Boller, K. J. (2012). Ground-state depletion for subdiffraction-limited spatial resolution in coherent anti-Stokes Raman. PHYSICAL REVIEW A, 86, 023825. https://doi.org/10.1103/PhysRevA.86.023825 (Original work published 2012)

Lee, C. J., & Boller, K. J. (2012). The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles. Optics Express, 20(12), 12793-12798. https://doi.org/10.1364/OE.20.012793 (Original work published 2025)

Bayraktar, M. ., Wessels, W. ., Lee, C. J., Van Goor, F. ., Koster, G. ., Rijnders, G. ., & Bijkerk, F. . (2012). Active multilayer mirrors for reflectance tuning at extreme ultraviolet (EUV) wavelengths. Journal of Physics D (Applied Physics), 45, 494001. https://doi.org/10.1088/0022-3727/45/49/494001 (Original work published 2012)

Chen, J. Q., Louis, E. ., Wormeester, H. ., Harmsen, R. ., van de Kruijs, R. ., Lee, C. J., … Bijkerk, F. . (2011). Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology, 22(10), 105705. https://doi.org/10.1088/0957-0233/22/10/105705 (Original work published 2025)