M. Lubomska

Chen, J. Q., Louis, E. ., Verhoeven, J. ., Harmsen, R. ., Lee, C. J., Lubomska, M. ., … Bijkerk, F. . (2010). Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science, 257, 354-361. Retrieved from <Go to ISI>://000281674200003 (Original work published 2025)

Chen, J. Q., Louis, E. ., Lee, C. J., Wormeester, H. ., Kunze, R. ., Schmidt, H. ., … Bijkerk, F. . (2009). Detection and characterization of carbon contamination on EUV multilayer mirrors. Optics Express, 17, 16969-16979. Retrieved from <Go to ISI>://000269736100067 (Original work published 2025)