J. Krzywinski

Chalupsky, J., Krzywinski, J., Juha, L., Hajkova, V., Cihelka, J., Burian, T., … Toleikis, S. (2010). Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express, 18, 27836-27845. Retrieved from <Go to ISI>://000285584200115 (Original work published 2025)

Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)

Nagler, B., Zastrau, U., Faustlin, R. R., Vinko, S. M., Whitcher, T., Nelson, A. J., … Wark, J. S. (2009). Turning solid aluminium transparent by intense soft X-ray photoionization. Nature Physics, 5, 693-696. Retrieved from <Go to ISI>://000270095600024 (Original work published 2025)

Nelson, A. J., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., … Lee, R. W. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express, 17, 18271-18278. Retrieved from <Go to ISI>://000270295300112 (Original work published 2025)