L. Vysin

Gaudin, J. ., Medvedev, V. V., Chalupsky, J. ., Burian, T. ., Farahani, D. ., Hajkova, V. ., … Ziaja, B. . (2013). Photon energy dependence of graphitization threshold for diamond irradiated with intense XUV FEL pulse. Physical Review B, 88, 060101. https://doi.org/10.1103/PhysRevB.88.060101

Gaudin, J. ., Peyrusse, O. ., Chalupsky, J. ., Toufarova, M. ., Vysin, L. ., Hajkova, V. ., … Bostedt, C. . (2012). Amorphous to crystalline phase transition in carbon induced by intense femtosecond x-ray free-electron laser pulses. Physical Review B, 86(2), 024103. https://doi.org/10.1103/PhysRevB.86.024103 (Original work published 2025)

Gaudin, J. ., Ozkan, C. ., Chalupsky, J. ., Bajt, S. ., Burian, T. ., Vysin, L. ., … Krzywinski, J. . (2012). Investigating the interaction of x-ray free electron laser radiation with grating structure. Optics Letters, 37(15), 3033-3035. https://doi.org/10.1364/OL.37.003033 (Original work published 2025)

Sobierajski, R. ., Bruijn, S. ., Khorsand, A. R., Louis, E. ., de Kruijs, R. ., Burian, T. ., … Bijkerk, F. . (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)

Vinko, S. M., Zastrau, U. ., Mazevet, S. ., Andreasson, J. ., Bajt, S. ., Burian, T. ., … Wark, J. S. (2010). Electronic Structure of an XUV Photogenerated Solid-Density Aluminum Plasma. Physical Review Letters, 104, 4. Retrieved from <Go to ISI>://000278207500016 (Original work published 2025)

Chalupsky, J. ., Krzywinski, J. ., Juha, L. ., Hajkova, V. ., Cihelka, J. ., Burian, T. ., … Toleikis, S. . (2010). Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express, 18, 27836-27845. Retrieved from <Go to ISI>://000285584200115 (Original work published 2025)

Khorsand, A. R., Sobierajski, R. ., Louis, E. ., Bruijn, S. ., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. . (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)

Nelson, A. J., Toleikis, S. ., Chapman, H. ., Bajt, S. ., Krzywinski, J. ., Chalupsky, J. ., … Lee, R. W. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express, 17, 18271-18278. Retrieved from <Go to ISI>://000270295300112 (Original work published 2025)