DIFFER

L. Vysin

First name
L.
Last name
Vysin
Gaudin, J., Medvedev, V. V., Chalupsky, J., Burian, T., Farahani, D., Hajkova, V., … Ziaja, B. (2013). Photon energy dependence of graphitization threshold for diamond irradiated with intense XUV FEL pulse. Physical Review B, 88, 060101. https://doi.org/10.1103/PhysRevB.88.060101
Gaudin, J., Peyrusse, O., Chalupsky, J., Toufarova, M., Vysin, L., Hajkova, V., … Bostedt, C. (2012). Amorphous to crystalline phase transition in carbon induced by intense femtosecond x-ray free-electron laser pulses. Physical Review B, 86(2), 024103. https://doi.org/10.1103/PhysRevB.86.024103 (Original work published 2025)
Gaudin, J., Ozkan, C., Chalupsky, J., Bajt, S., Burian, T., Vysin, L., … Krzywinski, J. (2012). Investigating the interaction of x-ray free electron laser radiation with grating structure. Optics Letters, 37(15), 3033-3035. https://doi.org/10.1364/OL.37.003033 (Original work published 2025)
Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., de Kruijs, R., Burian, T., … Bijkerk, F. (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)
Vinko, S. M., Zastrau, U., Mazevet, S., Andreasson, J., Bajt, S., Burian, T., … Wark, J. S. (2010). Electronic Structure of an XUV Photogenerated Solid-Density Aluminum Plasma. Physical Review Letters, 104, 4. Retrieved from <Go to ISI>://000278207500016 (Original work published 2025)
Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)
Chalupsky, J., Krzywinski, J., Juha, L., Hajkova, V., Cihelka, J., Burian, T., … Toleikis, S. (2010). Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express, 18, 27836-27845. Retrieved from <Go to ISI>://000285584200115 (Original work published 2025)
Nelson, A. J., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., … Lee, R. W. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express, 17, 18271-18278. Retrieved from <Go to ISI>://000270295300112 (Original work published 2025)