Nelson, A. J., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., … Lee, R. W. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express, 17, 18271-18278. Retrieved from <Go to ISI>://000270295300112 (Original work published 2025)
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