K. Tiedtke

Gaudin, J. ., Medvedev, V. V., Chalupsky, J. ., Burian, T. ., Farahani, D. ., Hajkova, V. ., … Ziaja, B. . (2013). Photon energy dependence of graphitization threshold for diamond irradiated with intense XUV FEL pulse. Physical Review B, 88, 060101. https://doi.org/10.1103/PhysRevB.88.060101

Sobierajski, R. ., Jurek, M. ., Chalupsky, J. ., Krzywinski, J. ., Burian, T. ., Farahani, S. D., … Gaudin, J. . (2013). Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids. Journal of Instrumentation, 8, P02010. https://doi.org/10.1088/1748-0221/8/02/p02010 (Original work published 2025)

Gaudin, J. ., Ozkan, C. ., Chalupsky, J. ., Bajt, S. ., Burian, T. ., Vysin, L. ., … Krzywinski, J. . (2012). Investigating the interaction of x-ray free electron laser radiation with grating structure. Optics Letters, 37(15), 3033-3035. https://doi.org/10.1364/OL.37.003033 (Original work published 2025)

Farahani, S. D., Chalupsky, J. ., Burian, T. ., Chapman, H. ., Gleeson, A. J., Hajkoya, V. ., … Gaudin, J. . (2011). Damage threshold of amorphous carbon mirror for 177 eV FEL radiation. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 635(1, Suppl.), S39-S42. https://doi.org/10.1016/j.nima.2010.10.133 (Original work published 2025)

Sobierajski, R. ., Bruijn, S. ., Khorsand, A. R., Louis, E. ., de Kruijs, R. ., Burian, T. ., … Bijkerk, F. . (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)

Chalupsky, J. ., Krzywinski, J. ., Juha, L. ., Hajkova, V. ., Cihelka, J. ., Burian, T. ., … Toleikis, S. . (2010). Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express, 18, 27836-27845. Retrieved from <Go to ISI>://000285584200115 (Original work published 2025)

Khorsand, A. R., Sobierajski, R. ., Louis, E. ., Bruijn, S. ., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. . (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)