DIFFER

S. Bruijn

First name
S.
Last name
Bruijn
Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2012). Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures. Journal of Applied Physics, 111(6), 064303. https://doi.org/10.1063/1.3693992 (Original work published 2025)
Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2011). In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science, 257(7), 2707-2711. https://doi.org/0.1016/j.apsusc.2010.10.049 (Original work published 2025)
Bruijn, S. (2011). Diffusion phenomena in chemically stabilized multilayer structures (University of Twente). University of Twente, Enschede, Netherlands. Retrieved from http://doc.utwente.nl/76952/ (Original work published 2011)
Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., de Kruijs, R., Burian, T., … Bijkerk, F. (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)
Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., & Bijkerk, F. (2010). Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology, 205, 2469-2473. Retrieved from <Go to ISI>://000286343100091 (Original work published 2025)
Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)