S. Hau-Riege

Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., de Kruijs, R., Burian, T., … Bijkerk, F. (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)

Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)