de Rooij-Lohmann, V. ., Kozhevnikov, I. V., Peverini, L. ., Ziegler, E. ., Cuerno, R. ., Bijkerk, F. ., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2025)
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