Weber, J. W., Hinrichs, K. ., Gensch, M. ., van de Sanden, M. C. M., & Oates, T. W. H. (2011). Microfocus infrared ellipsometry characterization of air-exposed graphene flakes. Applied Physics Letters, 99(6), 3. https://doi.org/10.1063/1.3624826 (Original work published 2025)
DIFFER