van der Laan, D. C., Douglas, J. F., Clickner, C. C., Stauffer, T. C., Goodrich, L. F., & van Eck, H. J. N. (2011). Evidence that the reversible strain effect on critical current density and flux pinning in Bi2Sr2Ca2Cu3Ox tapes is caused entirely by the pressure dependence of the critical temperature. Superconductor Science & Technology, 24(3), 032001. https://doi.org/10.1088/0953-2048/24/3/032001 (Original work published 2025)
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