M. A. Jakobs

Kappatou, A. ., Jaspers, R. J. E., Delabie, E. ., Marchuk, O. ., Biel, W. ., & Jakobs, M. A. (2012). Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration. Review of Scientific Instruments, 83, 10D519. https://doi.org/10.1063/1.4732847