DIFFER

Y. Xue

First name
Y.
Last name
Xue
Schlatmann, R. ., Keppel, A. ., Xue, Y. ., Verhoeven, J. ., & van der Wiel, M. J. (1993). Enhanced Reflectivity of Soft-X-Ray Multilayer Mirrors by Reduction of Si Atomic Density. Applied Physics Letters, 63, 3297-3299. https://doi.org/10.1063/1.110179 (Original work published)
View