B. C. A. M. van der Velden-Schuermans

Elam, F. ., Liu, Y. ., van der Velden-Schuermans, B. C. A. M., Starostin, S. A., van de Sanden, M. C. M., & de Vries, H. . (2018). Visible detection of performance controlling pinholes in silica encapsulation. Journal of Physics D: Applied Physics, 51(43), 43LT01. https://doi.org/10.1088/1361-6463/aadf4a

Elam, F. M., Starostin, S. A., Meshkova, A. S., van der Velden-Schuermans, B. C. A. M., Bouwstra, J. B., van de Sanden, M. C. M., & de Vries, H. W. (2017). Atmospheric pressure roll-to-roll plasma enhanced CVD of high quality silica-like bilayer encapsulation films. Plasma Processes and Polymers, (7), 1600143. https://doi.org/10.1002/ppap.201600143

Elam, F. M., van der Velden-Schuermans, B. C. A. M., Starostin, S. A., van de Sanden, M. C. M., & de Vries, H. W. (2017). Control of the intrinsic microstructure in AP-PECVD synthesised amorphous silica thin films. RSC Advances, 7(82), 52274-52282. https://doi.org/10.1039/C7RA10975J (Original work published 2017)