Meshkova, A. ., Starostin, S. A., van de Sanden, M. C. M., & de Vries, H. . (2018). Variable roughness development in statically deposited SiO2 thin films: a spatially resolved surface morphology analysis. Journal of Physics D: Applied Physics, 51(28), 285303. https://doi.org/10.1088/1361-6463/aacb1c (Original work published 2018)
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