E. V. Alieva

Alieva, E. V., Beitel, G., Kuzik, L. A., Sigarev, A. A., Yakovlev, V. A., Zhizhin, G. N., … van der Wiel, M. J. (1998). Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films. Journal of Molecular Structure, 449, 119-129. https://doi.org/10.1016/s0022-2860(98)00456-6 (Original work published)

Zhizhin, G. N., Alieva, E. V., Kuzik, L., Yakovlev, V. A., Shkrabo, D. M., van der Meer, A. F. G., & van der Wiel, M. J. (1998). Free-electron laser for infrared SEW characterization surfaces of conducting and dielectric solids and nm films on them. Applied Physics A-Materials Science & Processing, 67, 667-673. https://doi.org/10.1007/s003390050838 (Original work published 2025)

Alieva, E. V., Petrov, Y. E., Yakovlev, V. A., Eliel, E. R., van der Ham, E. W. M., Vrehen, Q. H. F., … Sychugov, V. A. (1997). Giant enhancement of sum-frequency generation upon excitation of a surface plasmon-polariton. Jetp Letters, 66, 609-613. https://doi.org/10.1134/1.567569 (Original work published)

Alieva, E. V., Beitel, G., Kuzik, L. A., Sigarev, A. A., Yakovlev, V. A., Zhizhin, G. N., … van der Wiel, M. J. (1997). Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films. Applied Spectroscopy, 51, 584-591. https://doi.org/10.1366/0003702971940657 (Original work published 2025)