DIFFER

E. V. Alieva

First name
E.
Middle name
V.
Last name
Alieva
Alieva, E. V., Beitel, G. ., Kuzik, L. A., Sigarev, A. A., Yakovlev, V. A., Zhizhin, G. N., … van der Wiel, M. J. (1998). Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films. Journal of Molecular Structure, 449, 119-129. https://doi.org/10.1016/s0022-2860(98)00456-6 (Original work published)
Zhizhin, G. N., Alieva, E. V., Kuzik, L. ., Yakovlev, V. A., Shkrabo, D. M., van der Meer, A. F. G., & van der Wiel, M. J. (1998). Free-electron laser for infrared SEW characterization surfaces of conducting and dielectric solids and nm films on them. Applied Physics a-Materials Science & Processing, 67, 667-673. https://doi.org/10.1007/s003390050838 (Original work published 2025)
Alieva, E. V., Beitel, G. ., Kuzik, L. A., Sigarev, A. A., Yakovlev, V. A., Zhizhin, G. N., … van der Wiel, M. J. (1997). Linear and nonlinear FEL-SEW spectroscopic characterization of nanometer-thick films. Applied Spectroscopy, 51, 584-591. https://doi.org/10.1366/0003702971940657 (Original work published 2025)
Alieva, E. V., Petrov, Y. E., Yakovlev, V. A., Eliel, E. R., van der Ham, E. W. M., Vrehen, Q. H. F., … Sychugov, V. A. (1997). Giant enhancement of sum-frequency generation upon excitation of a surface plasmon-polariton. Jetp Letters, 66, 609-613. https://doi.org/10.1134/1.567569 (Original work published)