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Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2004
|
| Journal |
Physical Review Letters
|
| Volume |
93
|
| Number |
11
|
| Date Published |
09/2004
|
| ISBN Number |
0031-9007
|
| Accession Number |
ISI:000223794400026
|
| URL | |
| PId |
2033ff8af79c14067dcc8b1b1a799b9d
|
Journal Article
|
|
| Download citation |
Citation
Berden, G., Jamison, S. P., MacLeod, A. M., Gillespie, W. A., Redlich, B., & van der Meer, A. F. G. (2004). Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. Physical Review Letters, 93. Retrieved from <Go to ISI>://000223794400026 (Original work published 2004)