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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum
| Label | Value |
|---|---|
| Author | |
| Abstract |
An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work. (c) 2008 Optical Society of America. |
| Year of Publication |
2008
|
| Journal |
Optics Express
|
| Volume |
16
|
| Number |
11
|
| Number of Pages |
8054-8054
|
| Date Published |
05/2008
|
| Type of Article |
Article
|
| ISBN Number |
1094-4087
|
| Accession Number |
ISI:000256469900052
|
| URL | |
| PId |
57cf6574209ae902cf601e3382e180bf
|
| Alternate Journal |
Opt. Express
|
Journal Article
|
|
| Download citation |
Citation
Adam, A. J. L., Brok, J. M., Seo, M. A., Ahn, K. J., Kim, D. S., Kang, J. H., … Planken, P. C. M. (2008). Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum. Optics Express, 16, 8054-8054. Retrieved from <Go to ISI>://000256469900052 (Original work published 2008)