Infrared transient grating measurements of the dynamics of hydrogen local mode vibrations in amorphous silicon-germanium

TitleInfrared transient grating measurements of the dynamics of hydrogen local mode vibrations in amorphous silicon-germanium
Publication TypeJournal Article
Year of Publication2008
AuthorsK.W Jobson, J.PR Wells, R.EI Schropp, N.Q Vinh, J.I Dijkhuis
JournalJournal of Applied Physics
Volume103
Number1
Pagination5
Date PublishedJan
Type of ArticleArticle
ISBN Number0021-8979
Accession NumberISI:000252890700006
KeywordsA-GE, ABSORPTION, ALLOYS, SI
Abstract

We report on picosecond, time-resolved measurements of the vibrational relaxation and decay pathways of the Si-H and Ge-H stretching modes in hydrogenated amorphous silicon-germanium thin films (a-SiGe: H). It is demonstrated that the decay of both modes has a nonexponential shape, attributable to the local environment of the Si-H and Ge-H bonds. Temperature dependent measurements of the ensemble averaged population decay time < T-1 > are used to demonstrate that the stretch modes relax to Si(Ge)-H bending modes and that the excess energy is dissipated,into a combination of bulk vibrations. The influence of the mixed character Si-Ge bulk vibrations upon the relaxation dynamics is discussed. (c) 2008 American Institute of Physics.

URL<Go to ISI>://000252890700006
Division

GUTHz

Department

FELIX

PID

5c6c22ec947e5420306032b38b9a344c

Alternate TitleJ. Appl. Phys.

Go back one page.