Title | Infrared transient grating measurements of the dynamics of hydrogen local mode vibrations in amorphous silicon-germanium |
Publication Type | Journal Article |
Year of Publication | 2008 |
Authors | K.W Jobson, J.PR Wells, R.EI Schropp, N.Q Vinh, J.I Dijkhuis |
Journal | Journal of Applied Physics |
Volume | 103 |
Number | 1 |
Pagination | 5 |
Date Published | Jan |
Type of Article | Article |
ISBN Number | 0021-8979 |
Accession Number | ISI:000252890700006 |
Keywords | A-GE, ABSORPTION, ALLOYS, SI |
Abstract | We report on picosecond, time-resolved measurements of the vibrational relaxation and decay pathways of the Si-H and Ge-H stretching modes in hydrogenated amorphous silicon-germanium thin films (a-SiGe: H). It is demonstrated that the decay of both modes has a nonexponential shape, attributable to the local environment of the Si-H and Ge-H bonds. Temperature dependent measurements of the ensemble averaged population decay time < T-1 > are used to demonstrate that the stretch modes relax to Si(Ge)-H bending modes and that the excess energy is dissipated,into a combination of bulk vibrations. The influence of the mixed character Si-Ge bulk vibrations upon the relaxation dynamics is discussed. (c) 2008 American Institute of Physics. |
URL | <Go to ISI>://000252890700006 |
Division | GUTHz |
Department | FELIX |
PID | 5c6c22ec947e5420306032b38b9a344c |
Alternate Title | J. Appl. Phys. |
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