Mid-infrared pump-probe spectroscopy of Si-H stretch modes in porous silicon

TitleMid-infrared pump-probe spectroscopy of Si-H stretch modes in porous silicon
Publication TypeJournal Article
Year of Publication2008
AuthorsK.W Jobson, J.PR Wells, N.Q Vinh, P.J Phillips, C.R Pidgeon, J.I Dijkhuis
JournalOptical Materials
Volume30
Number5
Pagination740-742
Date PublishedJan
Type of ArticleArticle
ISBN Number0925-3467
Accession NumberISI:000252554800020
KeywordsDYNAMICS
Abstract

Using the Dutch free electron laser FELIX, we have investigated vibrational relaxation in free standing porous silicon (p-Si) films. Pump-probe measurements resonant with the SiH, SiH2 and O3SiH stretching modes yield temperature dependent measurements of the decay rates which demonstrate that all the modes decay via at least one internal defect mode with the excess vibrational energy distributed among the Si-Si bath phonons in a fourth order decay process. (c) 2007 Elsevier B.V. All rights reserved.

URL<Go to ISI>://000252554800020
Division

GUTHz

Department

FELIX

PID

43407c9bb0974db615b76ce71a1d5ffb

Alternate TitleOpt. Mater.

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