Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

TitleSoft x-ray free electron laser microfocus for exploring matter under extreme conditions
Publication TypeJournal Article
Year of Publication2009
AuthorsA.J Nelson, S. Toleikis, H. Chapman, S. Bajt, J. Krzywinski, J. Chalupsky, L. Juha, J. Cihelka, V. Hajkova, L. Vysin, T. Burian, M. Kozlova, R.R Faustlin, B. Nagler, S.M Vinko, T. Whitcher, T. Dzelzainis, O. Renner, K. Saksl, A.R Khorsand, P.A Heimann, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, B. Iwan, J. Andreasson, N. Timneanu, M. Fajardo, J.S Wark, D. Riley, T. Tschentscher, J. Hajdu, R.W Lee
JournalOptics Express
Volume17
Number20
Pagination18271-18278
Date PublishedSep
Type of ArticleArticle
ISBN Number1094-4087
Accession NumberISI:000270295300112
KeywordsABLATION, BEAM, IRRADIATION, MOLECULAR-SOLIDS, PULSES, ULTRAVIOLET
Abstract

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of

URL<Go to ISI>://000270295300112
Division

nSI

PID

135107e88172797f1263006114b5e84b

Alternate TitleOpt. Express

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