Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

TitleElectro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH
Publication TypeJournal Article
Year of Publication2009
AuthorsB. Steffen, V. Arsov, G. Berden, W.A Gillespie, S.P Jamison, A.M MacLeod, A.FG van der Meer, P.J Phillips, H. Schlarb, B. Schmidt, P. Schmuser
JournalPhysical Review Special Topics-Accelerators and Beams
Volume12
Number3
Pagination16
Date PublishedMar
Type of ArticleArticle
ISBN Number1098-4402
Accession NumberISI:000266697100014
KeywordsTERAHERTZ PULSES
Abstract

Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.

URL<Go to ISI>://000266697100014
Division

GUTHz

Department

FELIX

PID

5c5f4f6d28a57c672a4372dbe77bbf4e

Alternate TitlePhys. Rev. Spec. Top.-Accel. Beams

Go back one page.