Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

TitleMethod to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration
Publication TypeJournal Article
Year of Publication2012
AuthorsA. Kappatou, R.JE Jaspers, E. Delabie, O. Marchuk, W. Biel, M.A Jakobs
JournalReview of Scientific Instruments
Volume83
Number10
Pagination10D519
Keywordscharge exchange, impurity absorption spectra, SPECTROSCOPY, Tokamak devices
Abstract

Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.

URLhttp://link.aip.org/link/?RSI/83/10D519/1
DOI10.1063/1.4732847
Division

FP

Department

PDG

PID

36634afb386a2b500b50860e1edfd577

Alternate TitleRev. Sci. Instrum.
LabelOA

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