| Title | Excite-Probe Determination of the Intersubband Lifetime in Wide Gaas/Algaas Quantum-Wells Using a Far-Infrared Free-Electron Laser |
| Publication Type | Journal Article |
| Year of Publication | 1994 |
| Authors | B.N Murdin, G.M.H. Knippels, A.FG van der Meer, C.R Pidgeon, C Langerak, M. Helm, W. Heiss, K. Unterrainer, E. Gornik, K.K Geerinck, N.J Hovenier, W.T Wenckebach |
| Journal | Semiconductor Science and Technology |
| Volume | 9 |
| Number | 8 |
| Pagination | 1554-1557 |
| Date Published | Aug |
| ISBN Number | 0268-1242 |
| Abstract | A direct excite-probe semiconductor lifetime determination in the picosecond regime has been made for the first time in the far infrared. We have used an RF-linac-pumped free-electron laser to determine the relaxation rate associated with intersubband absorption in GaAs/AlGaAs quantum wells having a subband separation smaller than the optical phonon energy. The measurement yields a relaxation lifetime of 40 +/- 5 ps. This is compared with a variety of other results obtained with less direct techniques. |
| DOI | 10.1088/0268-1242/9/8/019 |
| PID | 25940c42f870d0e5e4a0ce6d87d65b75 |
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