Publications

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1992
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. Verhoeven,  Ion-Bombardment of Thin-Layers - the Effect on the Interface Roughness and Its X-Ray Reflectivity, Review of Scientific Instruments 163 (1992) 1415-1419.
1991
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. Verhoeven,  Ion-Bombardment of X-Ray Multilayer Coatings - Comparison of Ion Etching and Ion Assisted Deposition, Applied Surface Science 347 (1991) 251-260.
F.J Puik, M.J van der Wiel, H. Zeijlemaker, J. Verhoeven,  Ion Etching of Thin W-Layers - Enhanced Reflectivity of W-C Multilayer Coatings, Applied Surface Science 147 (1991) 63-76.
1990
J. Verhoeven, H. Zeijlemaker, E.J Puik, M.J van der Wiel,  On the Use of H+ and Ar+ Ions for High Spatial-Resolution Depth Profiling, Vacuum 4-641 (1990) 1327-1329.
1988
E.J Puik, M.J van der Wiel, H. Zeijlemaker, J. Verhoeven,  The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors, Vacuum 8-1038 (1988) 707-709.